Title :
The impact of dielectric relaxation on ΣΔ-modulators
Author_Institution :
AMI Semicond., Oudenaarde
fDate :
Aug. 31 2008-Sept. 3 2008
Abstract :
This paper studies the impact of dielectric relaxation on SigmaDelta-modulators. Unlike the impact on SAR and pipeline ADCs, there seems to be no research reporting on the impact of the phenomenon on SigmaDelta-modulators. Nevertheless, the SC-integrators used in the circuit implementation of SigmaDelta-modulators too rely on the transfer of charge from one capacitor to another. So, there could be an important impact of dielectric relaxation on the performance of the SC-integrator and as such on the complete SigmaDelta-modulators. In this paper, we will show via simulations on a test case that SigmaDelta-modulators are in fact (quite) robust against the parasitic effect of dielectric relaxation. This result will be explained with a theoretical analysis of the phenomenon.
Keywords :
dielectric relaxation; sigma-delta modulation; dielectric relaxation; parasitic effect; sigma delta modulators; Ambient intelligence; Analog-digital conversion; Capacitors; Circuit simulation; Circuit testing; Dielectrics; Filters; Pipelines; Robustness; Voltage;
Conference_Titel :
Electronics, Circuits and Systems, 2008. ICECS 2008. 15th IEEE International Conference on
Conference_Location :
St. Julien´s
Print_ISBN :
978-1-4244-2181-7
Electronic_ISBN :
978-1-4244-2182-4
DOI :
10.1109/ICECS.2008.4675079
