Title :
Efficient testing of Σ-Δ A/D converters
Author_Institution :
Fac. for Electr. Eng., Univ. of Ljubljana, Ljubljana
fDate :
Aug. 31 2008-Sept. 3 2008
Abstract :
In this paper we discuss a possibility to simplify and speed up testing of high-resolution SigmaDelta modulators. The methodology could be used for production testing as well as for real time built-in self-tests. We show that a pseudo-random signal is a good option for a signal source and that test method leads to efficient and cost-effective production testing that can also be used for real time built-in self-tests. The method is theoretically analyzed and verified using Matlab simulations. The models of DUT and reference digital circuits are simulated and the difference is demonstrated with simple area-efficient algorithm/hardware.
Keywords :
analogue-digital conversion; built-in self test; circuit testing; delta-sigma modulation; reference circuits; DUT; Matlab simulations; Sigma-Delta A/D converters; built-in self-tests; high-resolution SigmaDelta modulators; production testing; pseudo-random signal; reference digital circuits; Automatic testing; Built-in self-test; Circuit simulation; Circuit testing; Costs; Digital modulation; Hardware; Integrated circuit technology; Integrated circuit testing; Production;
Conference_Titel :
Electronics, Circuits and Systems, 2008. ICECS 2008. 15th IEEE International Conference on
Conference_Location :
St. Julien´s
Print_ISBN :
978-1-4244-2181-7
Electronic_ISBN :
978-1-4244-2182-4
DOI :
10.1109/ICECS.2008.4675080
