DocumentCode :
3386655
Title :
AMS and RF design for reliability methodology
Author :
Ferreira, Pietro M. ; Petit, Hervé ; Naviner, Jean-François
Author_Institution :
Telecom ParisTech, Inst. Telecom, Paris, France
fYear :
2010
fDate :
May 30 2010-June 2 2010
Firstpage :
3657
Lastpage :
3660
Abstract :
The design for reliability concept is already in use on digital circuits, but not systematically in use on AMS or RF circuits. A reliable circuit design demands knowledge of the physical degradation and models to analyze the reliability in earlier stages. Also, it needs to be simple enough to be used on the redesign. In this work, we propose and validate an AMS and RF circuit design for reliability method. In order to investigate our method, we have designed a 5-3 NOR interpolative Digital Controlled Oscillator (DCO) near 1 GHz applications. This design example has presented 1.4% decrease of oscillation frequency, 0.2% decrease of phase noise for a 1 MHz off-set, and 2.1% decrease of power consumption after 10 years of degradation. According with the trends presented in Table I, we estimate that the fosc ageing degradation was improved of 13% by applying the design for reliability method.
Keywords :
NOR circuits; circuit reliability; radiofrequency oscillators; AMS circuit design; NOR interpolative digital controlled oscillator; RF circuit design; design for reliability concept; digital circuits; fosc ageing degradation; oscillation frequency; power consumption; reliability methodology; Aging; Circuit synthesis; Degradation; Design methodology; Digital circuits; Digital control; Digital-controlled oscillators; Energy consumption; Phase noise; Radio frequency;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
978-1-4244-5308-5
Electronic_ISBN :
978-1-4244-5309-2
Type :
conf
DOI :
10.1109/ISCAS.2010.5537771
Filename :
5537771
Link To Document :
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