Title :
Modeling and simulation of the interference due to digital switching in mixed-signal ICs
Author :
Demir, A. ; Feldmann, P.
Author_Institution :
Bell Labs, Murray Hill, NJ, USA
Abstract :
Introduces a methodology for the evaluation of the interference noise caused by digital switching activity in sensitive circuits of a mixed digital-analog chip. The digital switching activity is modeled stochastically as functions defined on Markov chains. The actual interference signal is obtained through the modulation of this discrete stochastic signal with real current injection patterns stored a priori in a pre-characterized library. The interference noise results from the propagation of these continuous stochastic signals through the linear network that models the chip power grid, substrate and relevant package parasitics. The interference noise power spectral density is computed by linear frequency-domain analysis. The methodology is implemented using advanced numerical techniques that are capable of tackling very large problems.
Keywords :
Markov processes; circuit simulation; frequency-domain analysis; interference (signal); linear network analysis; mixed analogue-digital integrated circuits; numerical analysis; switching circuits; Markov chains; chip power grid; continuous stochastic signal propagation; current injection patterns; digital switching; discrete stochastic signal modulation; interference modelling; interference noise power spectral density; interference signal; interference simulation; linear frequency-domain analysis; linear network; mixed digital-analog chip; mixed-signal IC; numerical techniques; package parasitics; precharacterized library; sensitive circuits; stochastic modelling; substrate; Circuit noise; Circuit simulation; Digital-analog conversion; Frequency domain analysis; Interference; Packaging; Power grids; Software libraries; Stochastic resonance; Switching circuits;
Conference_Titel :
Computer-Aided Design, 1999. Digest of Technical Papers. 1999 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-7803-5832-5
DOI :
10.1109/ICCAD.1999.810624