Title :
Minimal March tests for unlinked static faults in random access memories
Author :
Harutunvan, G. ; Vardanian, V.A. ; Zorian, Y.
Author_Institution :
Virage Logic, Yerevan, Armenia
Abstract :
New minimal March test algorithms are proposed for detection of (all) unlinked static faults in random access memories. In particular, a new minimal March MSS test of complexity I8N is introduced detecting all realistic simple static faults, as March SS (22N), (S. Hamdioui, van de Goor, Rodgers, MTDT 2002).
Keywords :
fault diagnosis; integrated circuit testing; random-access storage; minimal March MSS test; minimal March test algorithms; random access memories; unlinked static fault detection; unlinked static faults; Algorithm design and analysis; Design optimization; Failure analysis; Fault detection; History; Information analysis; Logic testing; Performance analysis; Process design; Random access memory;
Conference_Titel :
VLSI Test Symposium, 2005. Proceedings. 23rd IEEE
Print_ISBN :
0-7695-2314-5
DOI :
10.1109/VTS.2005.56
