Title :
Meeting the test challenges of the 1 Gbps parallel RapidIO® interface with new automatic test equipment capabilities
Author :
Aaberge, Darren ; Mockler, Ken ; Van Dinh, Dieu ; Belleau, Raoul ; Donovan, Tim ; Hewlitt, Reid
Author_Institution :
Networking & Comput. Syst. Group, Freescale Semicond. Inc., Austin, TX, USA
Abstract :
This paper describes an approach to testing the 1 Gbps Parallel RapidIO® interface specifications. The unique test requirements for this bus require the application of new test techniques as well as new ATE capabilities. ATE performance attributes important for parallel source-synchronous buses will be identified and presented with methods to measure these attributes.
Keywords :
automatic test equipment; peripheral interfaces; system buses; 1 Gbits/s; ATE capabilities; LVDS; automatic test equipment capabilities; parallel RapidIO interface; parallel source-synchronous buses; test requirements; Automatic test equipment; Automatic testing; Clocks; Computer networks; Jitter; Pins; Protocols; Semiconductor device testing; Timing; Voltage; ATE; Differential; LVDS; Non-determinism; RapidIO; Source-Synchronous;
Conference_Titel :
VLSI Test Symposium, 2005. Proceedings. 23rd IEEE
Print_ISBN :
0-7695-2314-5
DOI :
10.1109/VTS.2005.55
