Title :
Self-consistent integrated system for susceptibility to terrestrial neutron induced soft-error of sub-quarter micron memory devices
Author :
Yahagi, Yasuo ; Saito, Yuya ; Terunuma, K. ; Nunomiya, T. ; Nakamura, T.
Author_Institution :
Production Eng. Res. Lab., Hitachi Ltd, Yokohama, Japan
Abstract :
Concerns about Single Event Upset (SEU) induced by terrestrial neutron at the ground are growing as scaling down of semiconductor device proceeds. A highly integrated procedure named SECIS (SElf-Consistent Integrated System for susceptibility to terrestrial neutron soft-error) is proposed to estimate soft-error rate (SER) at any place on the earth. A good agreement is obtained from SECIS within 35% error between the measured and estimated SERs in three locations in Japan.
Keywords :
errors; neutron effects; semiconductor device testing; semiconductor storage; 0.25 micron; SECIS; self-consistent integrated system; semiconductor memory device testing; single event upset; soft error rate; terrestrial neutron irradiation; Acceleration; Charge measurement; Current measurement; Earth; Energy measurement; Neutrons; Nuclear measurements; Particle beams; Semiconductor devices; Single event upset;
Conference_Titel :
Integrated Reliability Workshop Final Report, 2002. IEEE International
Print_ISBN :
0-7803-7558-0
DOI :
10.1109/IRWS.2002.1194253
