DocumentCode
3387070
Title
ICECS 2008 at a glance
fYear
2008
fDate
Aug. 31 2008-Sept. 3 2008
Firstpage
3
Lastpage
6
Abstract
Provides a schedule of conference events and a listing of which papers were presented in each session.
Keywords
Analog-digital conversion; Automatic testing; Circuit testing; Design automation; Digital signal processing; Electronic equipment testing; Integrated circuit testing; Logic testing; Matrix converters; Signal design;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics, Circuits and Systems, 2008. ICECS 2008. 15th IEEE International Conference on
Conference_Location
St. Julien´s
Print_ISBN
978-1-4244-2181-7
Type
conf
DOI
10.1109/ICECS.2008.4675122
Filename
4675122
Link To Document