Title :
Dynamic testing of microprocessor protective relays with programmable logic capabilities
Author :
Apostolov, A.P. ; Weinbach, D.
Keywords :
Circuit faults; Logic devices; Logic testing; Microprocessors; Power system faults; Power system protection; Power system relaying; Programmable logic arrays; Programmable logic devices; Protective relaying;
Conference_Titel :
Digital Power System Simulators, 1995, ICDS '95., First International Conference on
Conference_Location :
Texas, USA
Print_ISBN :
0-7803-3227-X
DOI :
10.1109/ICDS.1995.492369
