DocumentCode :
3387106
Title :
3C: IP Session - Soft Errors [Breaker page]
fYear :
2005
fDate :
1-5 May 2005
Firstpage :
143
Lastpage :
143
Abstract :
Radiation induced soft errors impose a major challenge in the design of robust systems targeted for enterprise computing and networking applications. Major factors behind this trend include increasing system-level soft error rates with technology scaling, and stringent system data integrity requirements of target applications. There are several challenges and gaps in understanding system behaviors in the presence of soft errors. Excessive power, performance and area overheads challenge direct application of classical redundancy techniques for soft error detection and recovery. This session will present industrial perspectives on how to improve our understanding of system-level effects of soft errors and design techniques for soft error resilient robust systems.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2005. Proceedings. 23rd IEEE
Conference_Location :
Palm Springs, California, USA
ISSN :
1093-0167
Print_ISBN :
0-7695-2314-5
Type :
conf
DOI :
10.1109/VTS.2005.20
Filename :
1443412
Link To Document :
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