• DocumentCode
    3387188
  • Title

    4B: IP Session - Adaptive Test [breaker page]

  • fYear
    2005
  • fDate
    1-5 May 2005
  • Firstpage
    167
  • Lastpage
    167
  • Abstract
    Adaptive Test provides exciting possibilities to reduce test cost and increase quality by specifically targeting the parametrics and defects that require the most testing and reducing those that require less. It also provides an opportunity to target low cost testers and address the growing issue of systematic defects. This session will look at Adaptive/Optimal Test innovation from three perspectives. The first talk examines broadly what opportunities and models have been identified for cost and quality improvement. The second is an Industry perspective to show real life examples and issues related to Adaptive Test. The last will be a Commercial perspective to the type of the innovations being made available to the Industry.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2005. Proceedings. 23rd IEEE
  • Conference_Location
    Palm Springs, California, USA
  • ISSN
    1093-0167
  • Print_ISBN
    0-7695-2314-5
  • Type

    conf

  • DOI
    10.1109/VTS.2005.23
  • Filename
    1443416