DocumentCode
3387188
Title
4B: IP Session - Adaptive Test [breaker page]
fYear
2005
fDate
1-5 May 2005
Firstpage
167
Lastpage
167
Abstract
Adaptive Test provides exciting possibilities to reduce test cost and increase quality by specifically targeting the parametrics and defects that require the most testing and reducing those that require less. It also provides an opportunity to target low cost testers and address the growing issue of systematic defects. This session will look at Adaptive/Optimal Test innovation from three perspectives. The first talk examines broadly what opportunities and models have been identified for cost and quality improvement. The second is an Industry perspective to show real life examples and issues related to Adaptive Test. The last will be a Commercial perspective to the type of the innovations being made available to the Industry.
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2005. Proceedings. 23rd IEEE
Conference_Location
Palm Springs, California, USA
ISSN
1093-0167
Print_ISBN
0-7695-2314-5
Type
conf
DOI
10.1109/VTS.2005.23
Filename
1443416
Link To Document