DocumentCode :
3387188
Title :
4B: IP Session - Adaptive Test [breaker page]
fYear :
2005
fDate :
1-5 May 2005
Firstpage :
167
Lastpage :
167
Abstract :
Adaptive Test provides exciting possibilities to reduce test cost and increase quality by specifically targeting the parametrics and defects that require the most testing and reducing those that require less. It also provides an opportunity to target low cost testers and address the growing issue of systematic defects. This session will look at Adaptive/Optimal Test innovation from three perspectives. The first talk examines broadly what opportunities and models have been identified for cost and quality improvement. The second is an Industry perspective to show real life examples and issues related to Adaptive Test. The last will be a Commercial perspective to the type of the innovations being made available to the Industry.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2005. Proceedings. 23rd IEEE
Conference_Location :
Palm Springs, California, USA
ISSN :
1093-0167
Print_ISBN :
0-7695-2314-5
Type :
conf
DOI :
10.1109/VTS.2005.23
Filename :
1443416
Link To Document :
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