Title :
Novel programmable built-in current-sensor for analog, digital and mixed-signal circuits
Author :
Ekekon, Osman Kubilay ; Maltabas, Samed ; Margala, Martin
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Massachusetts Lowell, Lowell, MA, USA
fDate :
May 30 2010-June 2 2010
Abstract :
The paper presents a novel programmable BICS topology in IBM 65 nm CMOS technology. Programmability, which is the main motivation of this approach, is shown on three different CUTs, simultaneously. It is shown that proposed topology has 473 MHz bandwidth, 200.6ps detection time with 1.5μA sensitivity. Moreover, these specifications are achieved with only one control pin. The advantage on area overhead becomes more significant, as the number of CUTs increases in the system. These results show that proposed programmable BICS is superior when it is compared with recent works.
Keywords :
CMOS integrated circuits; mixed analogue-digital integrated circuits; sensors; IBM CMOS technology; analog circuits; bandwidth 473 MHz; current 1.5 muA; digital circuits; mixed-signal circuits; programmable BICS topology; programmable built-in current-sensor; size 65 nm; time 200.6 ps; Bandwidth; CMOS digital integrated circuits; CMOS technology; Circuit faults; Circuit testing; Circuit topology; Electrical fault detection; Fault detection; Semiconductor device modeling; Switches;
Conference_Titel :
Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
978-1-4244-5308-5
Electronic_ISBN :
978-1-4244-5309-2
DOI :
10.1109/ISCAS.2010.5537811
