DocumentCode
3387493
Title
Novel programmable built-in current-sensor for analog, digital and mixed-signal circuits
Author
Ekekon, Osman Kubilay ; Maltabas, Samed ; Margala, Martin
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Massachusetts Lowell, Lowell, MA, USA
fYear
2010
fDate
May 30 2010-June 2 2010
Firstpage
3545
Lastpage
3548
Abstract
The paper presents a novel programmable BICS topology in IBM 65 nm CMOS technology. Programmability, which is the main motivation of this approach, is shown on three different CUTs, simultaneously. It is shown that proposed topology has 473 MHz bandwidth, 200.6ps detection time with 1.5μA sensitivity. Moreover, these specifications are achieved with only one control pin. The advantage on area overhead becomes more significant, as the number of CUTs increases in the system. These results show that proposed programmable BICS is superior when it is compared with recent works.
Keywords
CMOS integrated circuits; mixed analogue-digital integrated circuits; sensors; IBM CMOS technology; analog circuits; bandwidth 473 MHz; current 1.5 muA; digital circuits; mixed-signal circuits; programmable BICS topology; programmable built-in current-sensor; size 65 nm; time 200.6 ps; Bandwidth; CMOS digital integrated circuits; CMOS technology; Circuit faults; Circuit testing; Circuit topology; Electrical fault detection; Fault detection; Semiconductor device modeling; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
Conference_Location
Paris
Print_ISBN
978-1-4244-5308-5
Electronic_ISBN
978-1-4244-5309-2
Type
conf
DOI
10.1109/ISCAS.2010.5537811
Filename
5537811
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