• DocumentCode
    3387493
  • Title

    Novel programmable built-in current-sensor for analog, digital and mixed-signal circuits

  • Author

    Ekekon, Osman Kubilay ; Maltabas, Samed ; Margala, Martin

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Massachusetts Lowell, Lowell, MA, USA
  • fYear
    2010
  • fDate
    May 30 2010-June 2 2010
  • Firstpage
    3545
  • Lastpage
    3548
  • Abstract
    The paper presents a novel programmable BICS topology in IBM 65 nm CMOS technology. Programmability, which is the main motivation of this approach, is shown on three different CUTs, simultaneously. It is shown that proposed topology has 473 MHz bandwidth, 200.6ps detection time with 1.5μA sensitivity. Moreover, these specifications are achieved with only one control pin. The advantage on area overhead becomes more significant, as the number of CUTs increases in the system. These results show that proposed programmable BICS is superior when it is compared with recent works.
  • Keywords
    CMOS integrated circuits; mixed analogue-digital integrated circuits; sensors; IBM CMOS technology; analog circuits; bandwidth 473 MHz; current 1.5 muA; digital circuits; mixed-signal circuits; programmable BICS topology; programmable built-in current-sensor; size 65 nm; time 200.6 ps; Bandwidth; CMOS digital integrated circuits; CMOS technology; Circuit faults; Circuit testing; Circuit topology; Electrical fault detection; Fault detection; Semiconductor device modeling; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-5308-5
  • Electronic_ISBN
    978-1-4244-5309-2
  • Type

    conf

  • DOI
    10.1109/ISCAS.2010.5537811
  • Filename
    5537811