DocumentCode :
3387529
Title :
Low-cost alternate EVM test for wireless receiver systems
Author :
Halder, Abhishek ; Chatterjee, A.
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2005
fDate :
1-5 May 2005
Firstpage :
255
Lastpage :
260
Abstract :
In digital radio applications, error-vector-magnitude (EVM) is the primary specification which quantifies the performance of digital modulation implemented in silicon. Production testing of EVM incurs high cost of test instrumentation in automated test equipment (ATE). For EVM testing of wireless receivers, the ATE must include an RF transmitter having (1) the required digital modulation capability, (2) transmitter parameter configurability via test automation software and (3) higher performance and accuracy compared to the receiver-under-test. In this paper, an alternate test methodology for the EVM specification is proposed that eliminates the need for high cost RF sources with digital modulation capability. A sequence of multi-tones generated using low-cost RF sources is used as test stimuli. The EVM specification is computed (predicted) by analyzing the degradation of the test signal by the receiver modules (e.g. LNAs, mixers, filters) by means of the observed waveforms in the baseband. Simulation results are presented.
Keywords :
automatic test equipment; digital radio; integrated circuit testing; modulation; radio receivers; radio transmitters; radiofrequency integrated circuits; EVM specification; RF transmitter; automated test equipment; digital modulation; digital radio; error vector magnitude; low-cost RF sources; low-cost alternate EVM testing; production testing; system testing; test automation software; test instrumentation; transmitter parameter configurability; wireless receiver systems; Automatic testing; Costs; Digital communication; Digital modulation; Radio frequency; Radio transmitters; Receivers; Silicon; Software testing; System testing; RF production tester; digital modulation; error-vector-magnitude; system testing; wireless communication;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2005. Proceedings. 23rd IEEE
Conference_Location :
Palm Springs, California, USA
ISSN :
1093-0167
Print_ISBN :
0-7695-2314-5
Type :
conf
DOI :
10.1109/VTS.2005.53
Filename :
1443432
Link To Document :
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