• DocumentCode
    3387674
  • Title

    Deep-UV LEDs using polarization-induced doping: Electroluminescence at cryogenic temperatures

  • Author

    Islam, S.M. ; Protasenko, Vladimir ; Rouvimov, Sergei ; Verma, Jai ; Huili Xing ; Jena, Debdeep

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Notre Dame, Notre Dame, IN, USA
  • fYear
    2015
  • fDate
    21-24 June 2015
  • Firstpage
    67
  • Lastpage
    68
  • Abstract
    Traditional impurity doping schemes are difficult for extreme-gap semiconductors, such as high Al content AlGaN alloys due to the large activation energies for donors and acceptors. Polarization-induced (or Pi-) doping, since its first demonstration [1], is being gradually implemented as an attractive alternative for effective p-type doping in large-bandgap nitride semiconductors both for power electronics, and for deep-UV photonics. Because mobile carriers are field-ionized instead of thermal ionization, they do not freeze out even at cryogenic temperatures. In this work we demonstrate polarization-induced doping deep-UV LEDs emitting in the 235-260 nm (5.25 to 4.75 eV) spectral range at both room temperature and at cryogenic temperatures. The effectiveness of polarization-induced doping is highlighted by a ~300% increase in the deep-UV EL intensity at 4 K compared to the value at 300 K.
  • Keywords
    aluminium alloys; carrier mobility; cryogenic electronics; electroluminescence; field ionisation; gallium alloys; light emitting diodes; polarisation; power electronics; semiconductor doping; AlGaN; acceptor; activation energy; cryogenic temperature; deep-UV LED; deep-UV photonic; donor; electroluminescence; extreme-gap semiconductor; field-ionization; impurity doping scheme; large bandgap nitride semiconductor; mobile carrier; p-type doping; polarization-induced doping; power electronic; thermal ionization; wavelength 235 nm to 260 nm; Artificial intelligence; Electroluminescence; Gallium nitride; Light emitting diodes; Optical imaging; Silicon; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference (DRC), 2015 73rd Annual
  • Conference_Location
    Columbus, OH
  • Print_ISBN
    978-1-4673-8134-5
  • Type

    conf

  • DOI
    10.1109/DRC.2015.7175559
  • Filename
    7175559