DocumentCode :
3388007
Title :
A high linearity, high efficiency pseudomorphic HEMT
Author :
Shanfield, S. ; Schindler, M. ; Aucoin, L. ; Platzker, A. ; Hoke, W. ; Lyman, P. ; Chu, S.L.G. ; Binder, R.
Author_Institution :
Raytheon, Lexington, MA, USA
fYear :
1997
fDate :
4-7 Oct. 1997
Firstpage :
207
Lastpage :
210
Abstract :
The authors report the third-order intermodulation distortion and phase deviation of 1.2-mm periphery double pulsed doped pseudomorphic high-electron-mobility transistors (HEMTs) at high levels of power and efficiency. A device tuned for single-tone power-added efficiency (PAE) of 59% with 0.87-W output power and 10.4 associated gain at 10 GHz could provide two-tone PAE of 50% with -19 dBc IM3/C and 0.30 W/tone. Single-tone phase deviation never exceeded 18 degrees from small signal with a phase deviation slope less than 3 degrees /dB. These measurements compare favorably to those of reported GaAs-based devices with comparable output power. A dry etched double recess structure was incorporated in the device for obtaining high reverse breakdown voltage and therefore high efficiency.<>
Keywords :
electric breakdown; etching; high electron mobility transistors; solid-state microwave devices; 0.87 W; 10 GHz; 59 percent; double pulsed doped pseudomorphic high-electron-mobility; dry etched double recess structure; high efficiency pseudomorphic HEMT; high linearity HEMT; output power; phase deviation; reverse breakdown voltage; single-tone power-added efficiency; third-order intermodulation distortion; two-tone PAE; Distortion measurement; Doping; Etching; Gallium arsenide; Intermodulation distortion; Linearity; Microwave transistors; PHEMTs; Power generation; Power measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 1992. Technical Digest 1992., 14th Annual IEEE
Conference_Location :
Miami Beach, FL, USA
Print_ISBN :
0-7803-0773-9
Type :
conf
DOI :
10.1109/GAAS.1992.247189
Filename :
247189
Link To Document :
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