• DocumentCode
    3388057
  • Title

    Spin-Hall effect MRAM based cache memory: A feasibility study

  • Author

    Jongyeon Kim ; Tuohy, Bill ; Cong Ma ; Won Ho Choi ; Ahmed, Ibrahim ; Lilja, David ; Kim, Chris H.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Minnesota, Minneapolis, MN, USA
  • fYear
    2015
  • fDate
    21-24 June 2015
  • Firstpage
    117
  • Lastpage
    118
  • Abstract
    One of the key objectives of STT-MRAM research has been on minimizing switching current while maintaining the required nonvolatility. To address this challenge, non-traditional MRAMs based on novel switching mechanisms have been proposed. In particular, spin-Hall effect (SHE) which utilizes large spin currents generated in the direction transverse to the charge current have been recently drawing attention [1]. Despite early promises such as lower switching current by means of efficient spin generation (i.e. Ispin/Icharge>100%) and longer device lifetime owing to the decoupled read and write paths, there is still a lack of a comprehensive study for benchmarking SHE-MRAM against other memory technologies. In this work, we explore the trade-off points across different levels of design abstraction (i.e. device, circuit, and architecture) to evaluate the feasibility of SHE-MRAM for large on-die cache memory.
  • Keywords
    MRAM devices; cache storage; STT-MRAM; device lifetime; on-die cache memory; spin-Hall effect; spin-hall effect; switching current; Delays; FinFETs; Integrated circuit modeling; Random access memory; Sensors; Tunneling magnetoresistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference (DRC), 2015 73rd Annual
  • Conference_Location
    Columbus, OH
  • Print_ISBN
    978-1-4673-8134-5
  • Type

    conf

  • DOI
    10.1109/DRC.2015.7175583
  • Filename
    7175583