11C: IP Session - Delay Fault Testing: Industrial Case Studies [Breaker page]

fYear

2005

fDate

1-5 May 2005

Firstpage

401

Lastpage

401

Abstract

Start of the above-titled section of the conference proceedings record.

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Test Symposium, 2005. Proceedings. 23rd IEEE

Conference_Location

Palm Springs, California, USA

ISSN

1093-0167

Print_ISBN

0-7695-2314-5

Type

conf

DOI

10.1109/VTS.2005.25

Filename

1443456

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