Title :
Soft error immune GaAs circuit technologies
Author :
Weatherford, T.R. ; Fouts, D.J. ; Marshall, P.W. ; Marshall, C.J. ; Dietrich, H.
Author_Institution :
Naval Postgraduate Sch., Monterey, CA, USA
Abstract :
Cosmic radiation induced soft errors present a major difficulty for space applications that utilize digital GaAs circuits and systems. Techniques to reduce soft error sensitivity by 5 orders of magnitude or more, to sufficient levels for safe implemention of GaAs ICs in space applications are presented. These results show that the need for redundancy and error correction is eliminated. Space systems will benefit by reduced power and area requirements, plus a substantial improvement in system performance over present radiation hardened silicon-based technologies.
Keywords :
III-V semiconductors; errors; field effect digital integrated circuits; gallium arsenide; integrated circuit technology; radiation hardening (electronics); space vehicle electronics; GaAs; GaAs ICs; cosmic radiation induced errors; digital GaAs circuits; radiation hardened GaAs-based technology; soft error immune IC technologies; soft error sensitivity reduction; space applications; Circuit simulation; Circuits and systems; Error analysis; Error correction; FETs; Frequency; Gallium arsenide; Logic circuits; MESFETs; Space technology;
Conference_Titel :
Circuits and Systems, 1997. Proceedings of the 40th Midwest Symposium on
Print_ISBN :
0-7803-3694-1
DOI :
10.1109/MWSCAS.1997.662273
