Title :
Graphene junction field-effect transistor
Author :
Tzu-Min Ou ; Borsa, Tomoko ; Van Zeghbroeck, Bart
Author_Institution :
Dept. of Electr., Comput., & Energy Eng., Univ. of Colorado - Boulder, Boulder, CO, USA
Abstract :
Summary form only given. Graphene is known for its high carrier mobility and high saturation velocity . The majority of graphene transistors in the literature-including MOSFETs, barristors, and tunneling FETs-have a gate separated from the channel by a conventional or high-K dielectric layer. In this paper we demonstrate for the first time a lateral graphene FET gated by a graphene/semiconductor heterojunction. The device consists of a p-type graphene channel and an n-type semiconductor gate. Since no metal/dielectric-stacked gate is used, the device is referred to as graphene junction FET (G-JFET). Such a device is of interest as an alternate to G-MOSFETs, or as a back gate for G-MOSFETs with the feature that the device´s Dirac voltage (VDirac) can be tuned by the doping density of semiconductor gate. This G-JFET device demonstrates for the first time the feasibility of using a graphene/n-semiconductor Schottky junction as the gate mechanism to control the conductivity of a graphene channel. The Schottky-junction back gate of a G-JFET also provides an additional degree of freedom to tune the VDirac of each individual transistor by doping specific regions underneath the graphene channel.
Keywords :
Schottky barriers; field effect transistors; graphene devices; C; Dirac voltage; G-MOSFET alternative; G-MOSFET back gate; gate mechanism; graphene channel conductivity control; graphene junction field effect transistor; graphene-semiconductor Schottky junction; graphene-semiconductor heterojunction; lateral graphene FET; n-type semiconductor gate; p-type graphene channel; Dielectrics; Doping; Gold; Graphene; High K dielectric materials; Logic gates; Transistors;
Conference_Titel :
Device Research Conference (DRC), 2015 73rd Annual
Conference_Location :
Columbus, OH
Print_ISBN :
978-1-4673-8134-5
DOI :
10.1109/DRC.2015.7175594