DocumentCode :
3388311
Title :
13C: Panel Session - Analog TRP: Is Convergence on Horizon? [Breaker page]
fYear :
2005
fDate :
1-5 May 2005
Firstpage :
451
Lastpage :
451
Abstract :
Many people call the current electronics era a ??consumer electronics?? era. Electronic gadgets, that have analog interfaces in audio, video or radio form, constantly surround us. While our hunger for new and fancy gadgets keeps growing, our price expectation for the same keeps dropping. The very word ??consumer?? in electronics manufacturing means that the part must have very low overall manufacturing cost to make it to the volume sales. This immense pressure of cost results in enormous pressure on test, leading manufacturers to find cost effective ways to use their test resources. Many companies have developed internal methods for testing the analog sections of their chips. This panel will address the question of whether a common approach is evolving across the efforts that are happening in the industry to be used as a general strategy by industry at large and to enable automated solutions via EDA & ATE.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2005. Proceedings. 23rd IEEE
Conference_Location :
Palm Springs, California, USA
ISSN :
1093-0167
Print_ISBN :
0-7695-2314-5
Type :
conf
DOI :
10.1109/VTS.2005.13
Filename :
1443466
Link To Document :
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