DocumentCode
3388330
Title
Author index
fYear
2005
fDate
5-5 May 2005
Firstpage
453
Lastpage
455
Abstract
The author index contains an entry for each author and coauthor included in the proceedings record.
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2005. Proceedings. 23rd IEEE
Conference_Location
Palm Springs, CA, USA
ISSN
1093-0167
Print_ISBN
0-7695-2314-5
Type
conf
DOI
10.1109/VTS.2005.32
Filename
1443467
Link To Document