• DocumentCode
    3388538
  • Title

    8-96 GHz on-wafer network analysis

  • Author

    Yu, R.Y. ; Pusl, J. ; Konishi, Y. ; Case, M. ; Kamegawa, M. ; Rodwell, M.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
  • fYear
    1997
  • fDate
    4-7 Oct. 1997
  • Firstpage
    75
  • Lastpage
    77
  • Abstract
    A millimeter-wave vector network analyzer is implemented with a monolithic GaAs directional time-domain reflectometer integrated circuit mounted directly on a microwave wafer probe. The vector network analyzer performs on-wafer network analysis up to 96 GHz with +or-1 dB accuracy.<>
  • Keywords
    MMIC; integrated circuit testing; network analysers; probes; time-domain reflectometry; 8 to 96 GHz; GaAs; MMIC; directional time-domain reflectometer; microwave wafer probe; millimeter-wave vector network analyzer; on-wafer network analysis; Bandwidth; Distributed parameter circuits; Gallium arsenide; Impedance; Millimeter wave technology; Sampling methods; Schottky diodes; Signal generators; Time domain analysis; Transmission line theory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 1992. Technical Digest 1992., 14th Annual IEEE
  • Conference_Location
    Miami Beach, FL, USA
  • Print_ISBN
    0-7803-0773-9
  • Type

    conf

  • DOI
    10.1109/GAAS.1992.247219
  • Filename
    247219