DocumentCode :
3388540
Title :
Monolithically integrated multi-color InGaN/GaN nanopillar light emitting diodes
Author :
Chu-Hsiang Teng ; Lei Zhang ; Yu-Lin Tsai ; Chien-Chung Lin ; Hao-Chung Kuo ; Hui Deng ; Ku, P.C.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
fYear :
2015
fDate :
21-24 June 2015
Firstpage :
161
Lastpage :
161
Abstract :
A lot of works have been done to explore the possibility of integrating multiple colors in one LED chip [1,2,3]. It has great potential in displays, imaging, sensors, and plenty of possible applications. Multi-color nanoLED arrays have been achieved by molecular-beam-epitaxy grown InGaN dot-in-wire structures [1,3] and colloidal quantum dot arrays [2]. However, they requires complicated manufacturing processes that could not be easily adopted for commercial products. Here we reported a scalable fabrication scheme to make monolithically integrated and electrically driven multi-color nanoLED arrays. The InGaN/GaN nanopillars can be easily fabricated from quantum well structures by lithography and dry etching, which are highly compatible to current LED technologies, and the emission wavelength can be tuned by manipulating nanopillar diameter and engineering strain relaxation effect. The proposed structure of multi-color nanoLED arrays is shown in Fig. 1. In addition, the nanopillar structure could improve the emission efficiency [4] and reduce efficiency droop [5]. All these advantages make nanopillars one of the most promising candidate for next-generation light emitting devices.
Keywords :
III-V semiconductors; etching; gallium compounds; indium compounds; light emitting diodes; lithography; nanoelectronics; wide band gap semiconductors; InGaN-GaN; dry etching; efficiency droop; electrically driven multicolor nanoLED arrays; emission wavelength; lithography; monolithically integrated light emitting diodes; multicolor nanopillar light emitting diodes; nanopillar diameter; quantum well structures; scalable fabrication scheme; strain relaxation effect; Fabrication; Gallium nitride; Gold; Image color analysis; Light emitting diodes; Lithography; Physics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference (DRC), 2015 73rd Annual
Conference_Location :
Columbus, OH
Print_ISBN :
978-1-4673-8134-5
Type :
conf
DOI :
10.1109/DRC.2015.7175605
Filename :
7175605
Link To Document :
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