DocumentCode
3388648
Title
Characterization of RF Devices using Two-Tone Probe Signals
Author
Martone, Anthony F. ; Delp, Edward J.
Author_Institution
School of Electrical and Computer Engineering, Purdue University, West Lafayette, Indiana
fYear
2007
fDate
26-29 Aug. 2007
Firstpage
161
Lastpage
165
Abstract
This paper describes a method for forensic characterization of RF devices using two-tone probe signals. When transmitted to an RF device, the two-tone signal is affected by nonlinear circuit components such as amplifiers or diodes. The nonlinear components cause intermodulation distortion to the input signal, which is reradiated by the device. Features of the intermodulation distortion products are used to construct a device fingerprint. The fingerprint is then used to characterize the device so that it can be identified from other RF devices.
Keywords
Diodes; Fingerprint recognition; Forensics; Intermodulation distortion; Nonlinear circuits; Probes; RF signals; Radio frequency; Radiofrequency amplifiers; Radiofrequency identification; Circuit Models; Forensic Characterization; Intermodulation Distortion; Probe Signals; RF Devices;
fLanguage
English
Publisher
ieee
Conference_Titel
Statistical Signal Processing, 2007. SSP '07. IEEE/SP 14th Workshop on
Conference_Location
Madison, WI, USA
Print_ISBN
978-1-4244-1198-6
Electronic_ISBN
978-1-4244-1198-6
Type
conf
DOI
10.1109/SSP.2007.4301239
Filename
4301239
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