Title :
Subtractive impairment, additive impairment and image visual quality
Author :
Li, Songnan ; Ngan, King Ngi
Author_Institution :
Dept. of Electron. Eng., Chinese Univ. of Hong Kong, Hong Kong, China
fDate :
May 30 2010-June 2 2010
Abstract :
In this paper, we propose an engineering-based image quality metric which distinguishes subtractive impairment from additive impairment. Since the amount of subtractive impairment is up-bounded by the total details within the reference image but the same limitation can´t be applied to additive impairment, intuitively visual quality degradation due to the two types of impairments should be measured differently. In the proposed metric, subtractive and additive impairments are separated and represented in the wavelet domain, and their influences to image visual quality is measured by different equations. We tested the proposed metric on five subjectively-rated databases and proved its effectiveness in objective image quality assessment.
Keywords :
image processing; additive impairment; engineering-based image quality metric; image processing; image visual quality; subtractive impairment; visual quality degradation; wavelet domain; Degradation; Design engineering; Differential equations; Distortion measurement; Image databases; Image processing; Image quality; Image restoration; Pollution measurement; Wavelet domain;
Conference_Titel :
Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
978-1-4244-5308-5
Electronic_ISBN :
978-1-4244-5309-2
DOI :
10.1109/ISCAS.2010.5537870