• DocumentCode
    3388748
  • Title

    Air-cooling extension - performance limits for processor cooling applications

  • Author

    Sauciuc, Ioan ; Chrysler, Greg ; Mahajan, Ravi ; Szleper, Michele

  • Author_Institution
    Intel Corp., Chandler, AZ, USA
  • fYear
    2003
  • fDate
    11-13 March 2003
  • Firstpage
    74
  • Lastpage
    81
  • Abstract
    The last two decades have seen a steady increase in microprocessor performance as silicon technology continues to scale in accordance with Moore\´s law. This increasing performance of the microprocessors is also associated with an increase in thermal design power and an increase in both average power density and local power density, commonly referred to as "hot spots". The thermal solutions must ensure that the junction temperature of the processor (die temperature) does not exceed temperatures in the 90-110°C range, typically at the hot spots, to ensure device performance and reliability. The majority of OEMs (original equipment manufacturers) within the microelectronics industry would like to achieve this by extending the application of air-cooling technologies. The objectives of this paper are: 1) to present the air-cooling extension for a range of "reasonable" boundary conditions; and 2) to introduce some novel technologies, which may substantially extend the air-cooling applications.
  • Keywords
    cooling; heat sinks; microprocessor chips; thermal management (packaging); thermal resistance; 90 to 110 degC; air-cooling boundary conditions; heat spreading; heat transfer coefficients; heatsinks; hot spots; microprocessor air-cooling extension; power density increase; processor cooling performance limits; processor junction temperature; thermal resistance; Boundary conditions; Cooling; Heat sinks; Microprocessors; Temperature distribution; Thermal engineering; Thermal factors; Thermal management; Thermal resistance; US Department of Energy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 2003. Ninteenth Annual IEEE
  • ISSN
    1065-2221
  • Print_ISBN
    0-7803-7793-1
  • Type

    conf

  • DOI
    10.1109/STHERM.2003.1194342
  • Filename
    1194342