DocumentCode :
3388759
Title :
Spur reduction in wideband PLLs by random positioning of charge pump current pulses
Author :
Thambidurai, Chembiyan ; Krishnapura, Nagendra
Author_Institution :
Dept. of Electr. Eng., Indian Inst. of Technol., Chennai, India
fYear :
2010
fDate :
May 30 2010-June 2 2010
Firstpage :
3397
Lastpage :
3400
Abstract :
Charge pump PLL is prone to reference spurs due to non-idealities like feedthrough, charge pump current mismatch and loop filter leakage. To resolve the problem of reference spurs, a randomization technique that converts the spurs to wideband noise is proposed. The added wideband noise has insignificant contribution to the output phase noise inside the PLL bandwidth. Analytical expressions are derived to study the effect of the randomization on the output phase noise. A 1 GHz output frequency PLL with a bandwidth of 1 MHz and a 20 MHz reference frequency is simulated to test the idea. From the simulated results we could see a spur reduction of 20 dB in the nominal case. The settling time of the simulated PLL measured for a 25.2 ppm settling error is 4.5 μs.
Keywords :
charge pump circuits; phase locked loops; PLL; charge pump current mismatch; charge pump current pulses; frequency 1 GHz; frequency 1 MHz; frequency 20 MHz; loop filter leakage; output phase noise; spur reduction; time 4.5 mus; wideband phase locked loops; Bandwidth; Charge pumps; Filters; Phase frequency detector; Phase locked loops; Phase noise; Steady-state; Switches; Voltage-controlled oscillators; Wideband;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
978-1-4244-5308-5
Electronic_ISBN :
978-1-4244-5309-2
Type :
conf
DOI :
10.1109/ISCAS.2010.5537876
Filename :
5537876
Link To Document :
بازگشت