Title :
Effect of thermocouple wire size and attachment method on measurement of thermal characteristics of electronic packages
Author :
Shaukatullah, H. ; Claassen, Alan
Author_Institution :
IBM Corp., Tucson, AZ, USA
Abstract :
During thermal characterization and testing of electronic equipment, the temperature of electronic components has to be measured. Thermocouples are commonly used for this purpose. The presence of a thermocouple on the surface of the component causes a local distortion of the temperature field and introduces errors in the measured temperature. This paper reviews the effect of thermocouple size and attachment method on the measurement of surface temperature to determine the thermal characteristics of plastic quad flat pack (PQFP) and tape ball grid array (TBGA) packages. Various size ANSI type T thermocouples were used. The methods of attachment included thermally conductive epoxy, nonthermally conductive epoxy, aluminum tape, and polyimide tape. Thermocouple wire size and attachment method can have a significant effect on the measurement of surface temperature and thermal characterization parameters. Small size and low thermal conductivity thermocouple wires are better to minimize errors due to heat losses through the wires. Using tapes and non-thermally conductive epoxy to attach thermocouples results in larger errors.
Keywords :
ball grid arrays; integrated circuit measurement; integrated circuit packaging; measurement errors; plastic packaging; polymers; temperature measurement; thermal conductivity; thermocouples; ANSI type T thermocouples; PQFP; TBGA; aluminum tape; electronic package thermal characteristics measurement; local temperature field distortion; nonthermally conductive epoxy; plastic quad flat pack; polyimide tape; surface temperature measurement errors; tape ball grid array package; thermal characterization; thermal conductivity; thermally conductive epoxy; thermocouple attachment methods; thermocouple wire size effects; wire heat losses; Distortion measurement; Electronic equipment; Electronic equipment testing; Electronic packaging thermal management; Electronics packaging; Packaging machines; Size measurement; Temperature measurement; Thermal conductivity; Wire;
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 2003. Ninteenth Annual IEEE
Print_ISBN :
0-7803-7793-1
DOI :
10.1109/STHERM.2003.1194345