DocumentCode :
3388875
Title :
Fundamental properties of source-excited field at the interface of a 2D EBG material
Author :
Capolino, Filippo ; Jackson, David R. ; Wilton, Donald R.
Author_Institution :
Dept. of Inf. Eng., Siena Univ., Italy
Volume :
2
fYear :
2004
fDate :
20-25 June 2004
Firstpage :
1171
Abstract :
An efficient numerical scheme has been introduced for calculating the field at the interface of a 2D EBG or periodic artificial material. An analysis of the branch point singularities in the complex wavenumber plane allows for a determination of the physical properties of the field. The asymptotic field behavior 1/(na)32/ that is predicted has been confirmed by calculations.
Keywords :
antenna radiation patterns; electromagnetic fields; periodic structures; 2D EBG material; branch point singularities; complex wavenumber plane; periodic artificial material; source-excited field; Antenna radiation patterns; Conducting materials; Electromagnetic analysis; Green´s function methods; Harmonic analysis; Metamaterials; Periodic structures; Phased arrays; Physics; Scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 2004. IEEE
Print_ISBN :
0-7803-8302-8
Type :
conf
DOI :
10.1109/APS.2004.1330391
Filename :
1330391
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3388875
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