Title :
Excimer laser assisted deposition of metal films on aluminum nitride
Author :
Lumpp, J.K. ; Hua Li ; Al-Banna, S.
Author_Institution :
Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA
Abstract :
Aluminum nitride (AlN) is a high thermal conductivity ceramic substrate for microelectronics with a better thermal coefficient of expansion match to silicon than traditional oxide substrates. Metallization techniques are needed to increase the ease of use of AlN as a substrate for high power circuits, high frequency devices, and multichip modules. Excimer laser assisted deposition of copper and aluminum addresses the need for repair and customization of interconnects, as well as a patterning technique for defining circuit features without photolithography. A KrF (248 nm) laser system with motion control stages, vacuum chamber, and heated stage, is used to decompose AlN to an aluminum rich metallic seed layer for laser induced chemical vapor deposition and electroless copper plating.
Keywords :
aluminium; aluminium compounds; ceramics; chemical vapour deposition; copper; electroless deposition; integrated circuit interconnections; integrated circuit metallisation; laser deposition; substrates; thermal expansion; 248 nm; AlN; AlN substrate; AlN-Al; AlN-Cu; KrF laser; aluminum; aluminum nitride; aluminum rich metallic seed layer; copper; electroless copper plating; excimer laser assisted deposition; heated stage; high thermal conductivity ceramic substrate; interconnects; laser induced chemical vapor deposition; metal films; metallization; microelectronics; motion control stages; patterning technique; thermal expansion coefficient; vacuum chamber; Aluminum nitride; Ceramics; Chemical lasers; Circuits; Copper; Metallization; Microelectronics; Silicon; Thermal conductivity; Thermal expansion;
Conference_Titel :
Advanced Applications of Lasers in Materials Processing/Broadband Optical Networks/Smart Pixels/Optical MEMs and Their Applications. IEEE/LEOS 1996 Summer Topical Meetings:
Conference_Location :
Keystone, CO, USA
Print_ISBN :
0-7803-3175-3
DOI :
10.1109/LEOSST.1996.540678