Title :
Optimized statistical analog fault simulation
Author :
Khouas, Abdelhakim ; Dessouky, Mohamed ; Derieux, Anne
Author_Institution :
Univ. Pierre et Marie Curie, Paris, France
Abstract :
A new statistical method for analog fault simulation is presented. The method takes into account process parameter variations and aims to reduce the number of the computational expensive Monte Carlo simulations often required during analog fault simulation. The technique is illustrated by means of a fifth-order low-pass switched-capacitor filter
Keywords :
Monte Carlo methods; analogue integrated circuits; circuit analysis computing; fault simulation; integrated circuit testing; statistical analysis; switched capacitor filters; Monte Carlo simulations; fault simulation algorithm; fifth-order SC filter; low-pass SC filter; optimized fault simulation; process parameter variations; statistical analog fault simulation; switched-capacitor filter; Analog circuits; Analog integrated circuits; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Electrical fault detection; Fault detection; Statistics; Transient analysis;
Conference_Titel :
Test Symposium, 1999. (ATS '99) Proceedings. Eighth Asian
Conference_Location :
Shanghai
Print_ISBN :
0-7695-0315-2
DOI :
10.1109/ATS.1999.810755
