DocumentCode :
3389545
Title :
The low voltage TFET demands higher perfection than previously required in electronics
Author :
Agarwal, Sapan ; Yablonovitch, Eli
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
fYear :
2015
fDate :
21-24 June 2015
Firstpage :
247
Lastpage :
248
Abstract :
Summary form only given. Tunneling Field Effect Transistors (TFETs) have the potential to achieve a low operating voltage by overcoming the thermally limited subthreshold swing of 60mV/decade, but results to date have been unsatisfying. Unfortunately, TFETs have only shown steep subthreshold swings at low currents of a nA/μm or lower while we would like a mA/μm. To understand this we need to consider the two switching mechanisms in a TFET. The gate voltage can be used to modulate the tunneling barrier thickness and thus the tunneling probability as shown Fig. 1(a). Alternatively, it is possible use energy filtering or density of states (DOS) switching as illustrated in Fig. 1(b). If the conduction and valence band don´t overlap, no current can flow. Once they do overlap, current can flow.
Keywords :
field effect transistors; low-power electronics; probability; switching; tunnel transistors; valence bands; DOS switching; density of states; energy filtering; gate voltage; low voltage TFET demands; subthreshold swing; switching mechanisms; tunneling barrier thickness; tunneling field effect transistors; tunneling probability; valence band; Electron traps; Joints; Laboratories; Logic gates; Nonhomogeneous media;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference (DRC), 2015 73rd Annual
Conference_Location :
Columbus, OH
Print_ISBN :
978-1-4673-8134-5
Type :
conf
DOI :
10.1109/DRC.2015.7175662
Filename :
7175662
Link To Document :
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