• DocumentCode
    3389545
  • Title

    The low voltage TFET demands higher perfection than previously required in electronics

  • Author

    Agarwal, Sapan ; Yablonovitch, Eli

  • Author_Institution
    Sandia Nat. Labs., Albuquerque, NM, USA
  • fYear
    2015
  • fDate
    21-24 June 2015
  • Firstpage
    247
  • Lastpage
    248
  • Abstract
    Summary form only given. Tunneling Field Effect Transistors (TFETs) have the potential to achieve a low operating voltage by overcoming the thermally limited subthreshold swing of 60mV/decade, but results to date have been unsatisfying. Unfortunately, TFETs have only shown steep subthreshold swings at low currents of a nA/μm or lower while we would like a mA/μm. To understand this we need to consider the two switching mechanisms in a TFET. The gate voltage can be used to modulate the tunneling barrier thickness and thus the tunneling probability as shown Fig. 1(a). Alternatively, it is possible use energy filtering or density of states (DOS) switching as illustrated in Fig. 1(b). If the conduction and valence band don´t overlap, no current can flow. Once they do overlap, current can flow.
  • Keywords
    field effect transistors; low-power electronics; probability; switching; tunnel transistors; valence bands; DOS switching; density of states; energy filtering; gate voltage; low voltage TFET demands; subthreshold swing; switching mechanisms; tunneling barrier thickness; tunneling field effect transistors; tunneling probability; valence band; Electron traps; Joints; Laboratories; Logic gates; Nonhomogeneous media;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference (DRC), 2015 73rd Annual
  • Conference_Location
    Columbus, OH
  • Print_ISBN
    978-1-4673-8134-5
  • Type

    conf

  • DOI
    10.1109/DRC.2015.7175662
  • Filename
    7175662