• DocumentCode
    3389983
  • Title

    Dynamic displacement current in subnanosecond breakdowns in an inhomogeneous electric field

  • Author

    Tarasenko, Victor F. ; Burachenko, Alexander G. ; Rybka, Dmitri V. ; Kostyrya, Igor D. ; Lomaev, M.I. ; Baksht, Evgenii Kh ; Shao, Tong ; Zhang, Chenghui ; Yan, Pei-guang

  • Author_Institution
    Inst. of High Current Electron., Tomsk, Russia
  • fYear
    2013
  • fDate
    20-23 Oct. 2013
  • Firstpage
    1054
  • Lastpage
    1057
  • Abstract
    The aim of the work was to take measurements during subnanosecond breakdowns with a time resolution no worse than 100 ps. The current through gaps filled with atmospheric pressure air was investigated during the generation of runaway electrons and X-rays. Three generators, when ensuring the formation of a runaway electrons preionized diffuse discharge (REP DD), were used. It is confirmed that during a subnanosecond voltage rise time, the amplitude of the dynamic displacement current can be higher than 4 kA. It is demonstrated that during the generation of supershort avalanches electron beams with amplitudes of 10 A and more. The conductivity in the air gap at the breakdown stage is ensured by the ionization wave, whose front propagates from the electrode of small curvature radius, and by the dynamic displacement current between the ionization wave front and the plane electrode.
  • Keywords
    X-rays; air gaps; avalanche breakdown; electric fields; electrical conductivity; electrodes; electron avalanches; REP DD; X-rays; air gap; current 10 A; dynamic displacement current; electrode; inhomogeneous electric field; ionization wave; runaway electrons preionized diffuse discharge; subnanosecond breakdown; supershort avalanche electron beam; Cathodes; Current measurement; Electron beams; Generators; Ionization; Oscilloscopes; Plasmas;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena (CEIDP), 2013 IEEE Conference on
  • Conference_Location
    Shenzhen
  • Type

    conf

  • DOI
    10.1109/CEIDP.2013.6748205
  • Filename
    6748205