Title :
Radiation characterization of a Monolithic nuclear event detector
Author :
Hash, G.L. ; Schwank, J.R. ; Shaneyfelt, M.R. ; Hughe, K.L. ; Connors, M.P. ; Swonger, J.W. ; van Vonno, N.W. ; Martin, R.L.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
Abstract :
A monolithic dose-rate nuclear event detector (NED) has been evaluated as a function of radiation pulse width. The dose-rate trip level of the NED was evaluated in ´near´ minimum and maximum sensitivity configurations for pulse widths from 20 to 250 ns and at dose rates from 106 to 109 rads(Si)/s. The trip level varied up to a factor of approximately 16 with pulse width. At each pulse width the trip level can be varied intentionally by adding external resistors. Neutron irradiations caused an increase in the trip level, while electron irradiations, up to a total-dose of 50 krads(Si), had no measurable effect. This adjustable dose-rate-level detector should prove valuable to designers of radiation-hardened systems.
Keywords :
bipolar integrated circuits; electron beam effects; military equipment; neutron effects; radiation detection and measurement; radiation hardening (electronics); radiation protection; semiconductor counters; Monolithic nuclear event detector; adjustable dose-rate-level detector; complementary bipolar process; dose-rate trip level; electron irradiations; neutron irradiation; radiation pulse width; radiation-hardened systems; Circuits; Control systems; Electrons; Event detection; Neutrons; Photodiodes; Radiation detectors; Resistors; Semiconductor radiation detectors; Space vector pulse width modulation;
Conference_Titel :
Radiation Effects Data Workshop, 1992. Workshop Record., 1992 IEEE
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-0930-8
DOI :
10.1109/REDW.1992.247320
