DocumentCode :
3390013
Title :
IR thermographic detection of defects in multi-layered composite materials used in military applications
Author :
Swiderski, W. ; Vavilov, V.
Author_Institution :
Mil. Inst. of Armament Technol., Zielonka
fYear :
2007
fDate :
2-9 Sept. 2007
Firstpage :
553
Lastpage :
556
Abstract :
Multi-layered composites are frequently used in many military applications as constructional materials and light armours protecting personnel and armament against fragments and bullets. Material layers can be very different by their physical properties. Therefore, such materials represent a difficult inspection task for many traditional techniques of non-destructive testing (NDT). Typical defects of composite materials are delaminations, a lack of adhesives, condensations and crumpling. IR thermographic NDT is considered as a candidate technique to detect such defects. In order to determine the potential usefulness of the thermal methods, specialized software has been developed for computing 3D (three- dimensional) dynamic temperature distributions in anisotropic six-layer solid bodies with subsurface defects. In this paper, both modeling and experimental results which illustrate advantages and limitations of IR thermography in inspecting composite materials will be presented.
Keywords :
composite materials; delamination; infrared imaging; nondestructive testing; temperature distribution; 3D dynamic temperature distributions; IR thermographic detection; NDT; adhesives; anisotropic six-layer solid bodies; inspection task; light armours protecting personnel; material layers; military applications; multilayered composite materials; nondestructive testing; Building materials; Composite materials; Delamination; Distributed computing; Infrared detectors; Inspection; Materials testing; Nondestructive testing; Personnel; Protection; IR thermography; NDT; composite materials;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Infrared and Millimeter Waves, 2007 and the 2007 15th International Conference on Terahertz Electronics. IRMMW-THz. Joint 32nd International Conference on
Conference_Location :
Cardiff
Print_ISBN :
978-1-4244-1438-3
Type :
conf
DOI :
10.1109/ICIMW.2007.4516626
Filename :
4516626
Link To Document :
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