Title :
Radiation design test data for advanced CMOS product
Author_Institution :
Nat. Semicond. Corp., South Portland, ME, USA
Abstract :
Radiation test data is presented for different radiation environments as performed on National Semiconductor´s FACT Advanced CMOS microcircuit family. Over twenty device types have been evaluated by independent investigators, users and by National.
Keywords :
CMOS integrated circuits; aerospace instrumentation; aerospace simulation; gamma-ray effects; integrated circuit testing; logic arrays; logic testing; military equipment; radiation hardening (electronics); space vehicles; FACT logic line; advanced CMOS product; radiation design test data; radiation hardness assurance; space environments; tactical environments; total ionising dose testing; Certification; Environmental economics; Logic design; Manufacturing processes; Military equipment; Packaging; Passivation; Performance evaluation; Semiconductor device manufacture; Semiconductor device testing;
Conference_Titel :
Radiation Effects Data Workshop, 1992. Workshop Record., 1992 IEEE
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-0930-8
DOI :
10.1109/REDW.1992.247323
