Title :
Total ionizing dose radiation characterization of the Natel HSRD1056RH resolver-to-digital converter hybrid
Author :
Lee, C.I. ; Hill, R.E. ; Nies, K.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
The total ionizing dose (TID) test of the Natel HSRD1056RH synchro/resolver-to-digital converter for the space environment has been completed using the 60Co source at JPL. A classical ´rebound´ effect was observed during time dependent effects (TDE) test due to slight parametric drifts of the internal CMOS circuitry. Circuit analysis suggested a ´quick fix´ to this sensitivity which was verified by testing of modified devices. The large conversion error was found due to the high frequency, rather than the ionizing dose radiation.
Keywords :
aerospace computer control; aerospace instrumentation; aerospace simulation; analogue-digital conversion; attitude control; gamma-ray effects; radiation hardening (electronics); synchros; Cassini spacecraft; Natel HSRD1056RH; conversion error; internal CMOS circuitry; parametric drifts; resolver-to-digital converter hybrid; space control systems; space environment; time dependent effects; total ionizing dose radiation characterization; Aerospace electronics; Analog-digital conversion; Circuit testing; Control systems; Ionizing radiation; Laboratories; Propulsion; Space technology; Transducers; Voltage;
Conference_Titel :
Radiation Effects Data Workshop, 1992. Workshop Record., 1992 IEEE
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-0930-8
DOI :
10.1109/REDW.1992.247325
