A summary of recent VLSI SEU and latch-up testing (for space application)

Author

Kinnison, James D. ; Maurer, Richard H. ; McKerracher, Priscilla L. ; Carkhuff, Bliss G.

Author_Institution

Appl. Phs. Lab., Johns Hopkins Univ., Laurel, MD, USA

fYear

1992

fDate

1992

Firstpage

12

Lastpage

15

Abstract

As the complexity of satellite systems increases, interest in using highly integrated microelectronic devices also increases. The SEU and latch-up characteristics of these devices are usually not known. Therefore, thorough testing should be performed on an VLSI device that is considered for use in space systems. The authors detail the results of a series of SEU and latch-up tests on VLSI devices of interest for use in future satellite systems and describe their test system designed to efficiently perform these tests.

Keywords

VLSI; aerospace instrumentation; aerospace simulation; aerospace testing; integrated circuit testing; ion beam effects; microcontrollers; radiation hardening (electronics); reduced instruction set computing; FRISC test computer; SEU testing; VLSI devices; heavy ion effects; latch-up testing; satellite systems; test system; Circuit testing; Ion beams; Laboratories; Microprocessors; Performance evaluation; Satellites; Single event upset; System testing; Test equipment; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation Effects Data Workshop, 1992. Workshop Record., 1992 IEEE

Conference_Location

New Orleans, LA, USA

Print_ISBN

0-7803-0930-8

Type

conf

DOI

10.1109/REDW.1992.247331

Filename

247331