Title :
SEU tests of a 80386 based flight-computer/data-handling system and of discrete PROM and EEPROM devices, and SEL tests of discrete 80386, 80387, PROM, EEPROM and ASICs
Author :
LaBel, Ken ; Stassinopoulos, E.G. ; Brucker, G.J. ; Stauffer, C.A.
Author_Institution :
NASA/Goddard Space Flight Center, Greenbelt, MD, USA
Abstract :
The Small Explorer Data System (SEDS) is a spacecraft Command and Data Handling subsystem for the Solar Anomalous Magnetospheric Particle Explorer (SAMPEX) mission at Goddard Space Flight Center. This present work involves the combination of the MIL-STD-1773 bus system and a flight computer which is included as a critical portion of the SEDS. The results of the discrete parts tests for the EEPROM, PROM, ASICs (Bus and Serial Controller), 80386, and 80387, and the complete data system test (SEDS) operating as a unit are presented. The results show that the SEDs can satisfy the requirements of the SAMPEX mission.
Keywords :
EPROM; PROM; aerospace computing; aerospace instrumentation; aerospace simulation; aerospace testing; application specific integrated circuits; integrated circuit testing; ion beam effects; radiation hardening (electronics); system buses; 80386 based; 80387 devices; ASICs; EEPROM devices; INTEL parts single event latchup; MIL-STD-1773 bus system; SAMPEX mission; SEU tests; Small Explorer Data System; Solar Anomalous Magnetospheric Particle Explorer; discrete PROM; discrete parts tests; flight-computer/data-handling system; heavy ion tests; spacecraft Command and Data Handling subsystem; Application specific integrated circuits; Control systems; Data systems; EPROM; Hardware; PROM; Single event upset; Solid state circuits; Space vehicles; System testing;
Conference_Titel :
Radiation Effects Data Workshop, 1992. Workshop Record., 1992 IEEE
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-0930-8
DOI :
10.1109/REDW.1992.247332
