Title :
Workshop Record 1992 IEEE Radiation Effects Data Workshop (Cat. No.92TH0507-4)
Abstract :
Presents the cover from the proceedings of this conference.
Keywords :
VLSI; aerospace instrumentation; aerospace simulation; digital integrated circuits; integrated circuit testing; radiation effects; radiation hardening (electronics); space vehicles; CMOS circuits; memories; microprocessors; radiation effects data; radiation hardened circuits; related part types; single part types; single-event phenomena;
Conference_Titel :
Radiation Effects Data Workshop, 1992. Workshop Record., 1992 IEEE
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-0930-8
DOI :
10.1109/REDW.1992.247333
