Title :
Airborne molecular contamination: On-line analytical system for real time contamination control
Author :
Illuzzi, Francesca ; Sonego, Patrizia ; Landoni, Cristian ; Solcia, Carolina ; Succi, Marco ; Bacon, Tad ; Webber, Kun
Author_Institution :
ST Microelectron., Milano, Italy
fDate :
31 March-1 April 2003
Abstract :
The attention of the IC makers for AMC contamination is gaining interest, in particular for its determination with real time techniques. For this purpose a dedicated system has been developed and tested. It allows determining total amines, total acids and multiple specific organic compounds. The data obtained during the test have shown that the concentration of impurities can often be related to production or maintenance processes and that their presence is characteristic for each area. Particular attention must also be paid to monitoring the filter efficiency.
Keywords :
clean rooms; filtration; integrated circuit manufacture; process monitoring; real-time systems; surface contamination; IC manufacturing; acid; airborne molecular contamination; amine; clean room; filter efficiency monitoring; impurity concentration; maintenance process; on-line analytical system; production process; real-time contamination control; volatile organic compound; Contamination; Control systems; Detectors; Gettering; Impurities; Instruments; Organic compounds; Production; Real time systems; System testing;
Conference_Titel :
Advanced Semiconductor Manufacturing Conference and Workshop, 2003 IEEEI/SEMI
Print_ISBN :
0-7803-7681-1
DOI :
10.1109/ASMC.2003.1194487