• DocumentCode
    3390354
  • Title

    Airborne molecular contamination: On-line analytical system for real time contamination control

  • Author

    Illuzzi, Francesca ; Sonego, Patrizia ; Landoni, Cristian ; Solcia, Carolina ; Succi, Marco ; Bacon, Tad ; Webber, Kun

  • Author_Institution
    ST Microelectron., Milano, Italy
  • fYear
    2003
  • fDate
    31 March-1 April 2003
  • Firstpage
    160
  • Lastpage
    164
  • Abstract
    The attention of the IC makers for AMC contamination is gaining interest, in particular for its determination with real time techniques. For this purpose a dedicated system has been developed and tested. It allows determining total amines, total acids and multiple specific organic compounds. The data obtained during the test have shown that the concentration of impurities can often be related to production or maintenance processes and that their presence is characteristic for each area. Particular attention must also be paid to monitoring the filter efficiency.
  • Keywords
    clean rooms; filtration; integrated circuit manufacture; process monitoring; real-time systems; surface contamination; IC manufacturing; acid; airborne molecular contamination; amine; clean room; filter efficiency monitoring; impurity concentration; maintenance process; on-line analytical system; production process; real-time contamination control; volatile organic compound; Contamination; Control systems; Detectors; Gettering; Impurities; Instruments; Organic compounds; Production; Real time systems; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference and Workshop, 2003 IEEEI/SEMI
  • ISSN
    1078-8743
  • Print_ISBN
    0-7803-7681-1
  • Type

    conf

  • DOI
    10.1109/ASMC.2003.1194487
  • Filename
    1194487