DocumentCode
3390354
Title
Airborne molecular contamination: On-line analytical system for real time contamination control
Author
Illuzzi, Francesca ; Sonego, Patrizia ; Landoni, Cristian ; Solcia, Carolina ; Succi, Marco ; Bacon, Tad ; Webber, Kun
Author_Institution
ST Microelectron., Milano, Italy
fYear
2003
fDate
31 March-1 April 2003
Firstpage
160
Lastpage
164
Abstract
The attention of the IC makers for AMC contamination is gaining interest, in particular for its determination with real time techniques. For this purpose a dedicated system has been developed and tested. It allows determining total amines, total acids and multiple specific organic compounds. The data obtained during the test have shown that the concentration of impurities can often be related to production or maintenance processes and that their presence is characteristic for each area. Particular attention must also be paid to monitoring the filter efficiency.
Keywords
clean rooms; filtration; integrated circuit manufacture; process monitoring; real-time systems; surface contamination; IC manufacturing; acid; airborne molecular contamination; amine; clean room; filter efficiency monitoring; impurity concentration; maintenance process; on-line analytical system; production process; real-time contamination control; volatile organic compound; Contamination; Control systems; Detectors; Gettering; Impurities; Instruments; Organic compounds; Production; Real time systems; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Manufacturing Conference and Workshop, 2003 IEEEI/SEMI
ISSN
1078-8743
Print_ISBN
0-7803-7681-1
Type
conf
DOI
10.1109/ASMC.2003.1194487
Filename
1194487
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