Title :
Classification-Error Cost Minimization Strategy: DCMS
Author :
Parikh, Devi ; Chen, Tsuhan
Author_Institution :
Carnegie Mellon University, Department of Electrical and Computer Engineering, Pittsburgh, PA, USA. dparikh@cmu.edu
Abstract :
Several classification applications such as intrusion detection, biometric recognition, etc. have different costs associated with different classification errors. In such scenarios, the goal is to minimize the cost incurred, and not the classification error rate itself. This paper proposes a Cost Minimization Strategy, dCMS, which when applied to classifiers, provides a boost in the performance by reducing the cost incurred due to classification errors. dCMS is classifier-type independent, however it exploits the statistical properties of the trained classifier. It does not require classifiers to be retrained, which is particularly advantageous in scenarios where the costs vary dynamically. Convincing results are provided which indicate the statistically significant reduction in cost incurred by applying dCMS, in a diverse set of classification scenarios with datasets and classifiers of varying complexities.
Keywords :
Application software; Biometrics; Computer errors; Cost function; Distributed computing; Error analysis; Fingerprint recognition; Histograms; Intrusion detection; Volatile organic compounds; Learn++; combining classifiers; cost minimization; dCMS; intrusion detection; optical character recognition; volatile organic compounds;
Conference_Titel :
Statistical Signal Processing, 2007. SSP '07. IEEE/SP 14th Workshop on
Conference_Location :
Madison, WI, USA
Print_ISBN :
978-1-4244-1198-6
Electronic_ISBN :
978-1-4244-1198-6
DOI :
10.1109/SSP.2007.4301333