Title :
Wavelet analysis of current measurements for mixed-signal circuit testing
Author :
Dimopoulos, M.G. ; Papakostas, D.K. ; Vassios, B.D. ; Hatzopoulos, A.A.
Author_Institution :
Dept. of Electron., Alexander Tech. Educat. Inst. of Thessaloniki, Thessaloniki, Greece
fDate :
May 30 2010-June 2 2010
Abstract :
In this paper a test method based on the wavelet transformation of the measured supply current (IPS) and load current (IL) waveforms is presented. In the wavelet analysis, the test metrics used are utilizing the initial three decomposition levels of the measured signal. Experimental comparative results between the proposed method, a test method based on the RMS value of IPS, a test method utilizing the harmonic magnitude components of the IPS spectrum and a method based on the wavelet transformation of the IPS are presented showing the effectiveness of the proposed testing scheme.
Keywords :
electric current measurement; integrated circuit testing; mixed analogue-digital integrated circuits; wavelet transforms; current measurement; decomposition levels; harmonic magnitude components; load current; mixed-signal circuit testing; supply current; wavelet analysis; wavelet transformation; Circuit testing; Continuous wavelet transforms; Current measurement; Current supplies; Discrete wavelet transforms; Electrical fault detection; Fourier transforms; Frequency; Wavelet analysis; Wavelet transforms;
Conference_Titel :
Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
978-1-4244-5308-5
Electronic_ISBN :
978-1-4244-5309-2
DOI :
10.1109/ISCAS.2010.5537999
