Title :
Nonlinear FDTD solution to the high-field conduction model for some solid dielectrics [microstrip structure example]
Author :
Dong, X.T. ; Yin, W.-Y. ; Gan, Y.B.
Author_Institution :
Temasek Labs., Nat. Univ. of Singapore, Singapore
Abstract :
To accurately predict and describe the breakdown of a dielectric that occurred in an electronic device or system is a very challenging task. The finite-difference time-domain (FDTD) method is one of the most popular full-wave numerical algorithms. As a time-domain method, it is especially powerful in modeling transient electromagnetic phenomena, such as the high power pulse penetrating and coupling into electric systems, etc. In this work, a nonlinear FDTD solution to the high field conduction model of some typical solid dielectrics is proposed, where inner iterations are taken to handle the nonlinear relationship between the field strength and material properties. Numerical examples are given for a microstrip structure.
Keywords :
electric breakdown; finite difference time-domain analysis; high field effects; iterative methods; microstrip circuits; transient response; field strength/material properties nonlinear relationship; full-wave numerical methods; high power pulse; high-field conduction model; inner iterations; microstrip structure; nonlinear FDTD; solid dielectric breakdown; transient electromagnetic phenomena; Dielectric breakdown; Dielectric devices; Electromagnetic coupling; Electromagnetic modeling; Electromagnetic transients; Finite difference methods; Microstrip; Power system modeling; Solid modeling; Time domain analysis;
Conference_Titel :
Antennas and Propagation Society International Symposium, 2004. IEEE
Print_ISBN :
0-7803-8302-8
DOI :
10.1109/APS.2004.1330522