DocumentCode :
3391526
Title :
Modular approach to continuous process yield improvements
Author :
Koepf, R. ; Hummel, M.
Author_Institution :
SMST GmbH, Boblingen, Germany
fYear :
1997
fDate :
10-12 Sep 1997
Firstpage :
170
Lastpage :
174
Abstract :
Todays highly competitive marketplace enforces semiconductor manufacturers to continuously improve their key productivity figures such as cycle time, electrical yield and process yield. At SMST a Modular Quality System (MQS) has been established at in order to get proactive control over the base contributors that lead to losses in the process yield area. The MQS approach is based on creating personalised ownership. Therefore the major contributors to process yield have been identified, measurements have been established and the actual performance of these modules has been assigned to individual module owners in the MQS Core Team. These module owners are leading crossfunctional action teams, that are responsible for the definition of corrective actions, when the agreed upon targets are not met. The key success factor of the MQS system is based on the approach to establish a personalised ownership and a sense of responsibility for each individual problem or event
Keywords :
human resource management; integrated circuit yield; quality control; semiconductor device manufacture; MQS; SMST; crossfunctional action team; modular quality system; personalised ownership; process yield; productivity; semiconductor manufacturer; Costs; Human factors; International collaboration; Manufacturing processes; Performance loss; Productivity; Semiconductor device manufacture; Stability; Testing; Turning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Manufacturing Conference and Workshop, 1997. IEEE/SEMI
Conference_Location :
Cambridge, MA
ISSN :
1078-8743
Print_ISBN :
0-7803-4050-7
Type :
conf
DOI :
10.1109/ASMC.1997.630728
Filename :
630728
Link To Document :
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