Title :
Design of a measurement and interface integrated circuit for characterization of switched current memory cells
Author :
Pereira, Adriano M. ; Pimenta, Tales C. ; Moreno, Robson L. ; Charry, Edgar R. ; Jorge, Alberto M.
Author_Institution :
EFEI, Itajuba, Brazil
Abstract :
Dynamic current mirrors, or SI current cells, are widely used in analog signal processing circuits. They could be implemented using a standard cell methodology if an SI cell library is available. Aiming at the creation of that library, this work presents the design of the measuring system and the interface circuits (on a chip) necessary to test SI cells with precision of 450 ppm and operation frequency of 3 MHz. Measurements performed on the prototypes show that the harmonics components and the noise level are 70 dB smaller than the fundamental and the total harmonic distortion is 0.04%
Keywords :
analogue integrated circuits; analogue processing circuits; analogue storage; integrated circuit design; integrated circuit testing; switched current circuits; SI cell library; SI current cells; SI memory cell characterization; THD; dynamic current mirrors; harmonics components; measurement/interface IC design; noise level; switched current memory cells; total harmonic distortion; Circuit testing; Distortion measurement; Frequency measurement; Integrated circuit measurements; Libraries; Mirrors; Noise measurement; Semiconductor device measurement; Signal processing; System testing;
Conference_Titel :
VLSI Design, 1998. Proceedings., 1998 Eleventh International Conference on
Conference_Location :
Chennai
Print_ISBN :
0-8186-8224-8
DOI :
10.1109/ICVD.1998.646610
