Title :
Fractional-order derivative spectroscopy for resolving overlapped Lorenztian peak-signals
Author :
Li, Yuan-lu ; Hu, Li
Author_Institution :
Coll. of Inf. & Control, Nanjing Univ. of Inf. Sci. & Technol., Nanjing, China
Abstract :
Fractional-order derivative spectroscopy has been developed to resolve the overlapped Lorentzian peak-signals. Resolutions are directly characterized by spectral parameters extracted from the overlapped peak-signals. For this purpose, using the Haar wavelet as a tool we design a fractional-order differentiator to develop the fractional-order derivative spectroscopy. As the application of the proposed method, simulated overlapped Lorentzian peaks has been resolved. Results indicate the proposed method can be used to resolve overlapped Lorentzian peaks effectively and satisfactorily.
Keywords :
signal resolution; spectral analysis; wavelet transforms; Haar wavelet; fractional-order derivative spectroscopy; fractional-order differentiator; overlapped Lorenztian peak-signals; overlapped peak-signals; signal resolutions; simulated overlapped Lorentzian peaks; spectral parameters; Computers; Information science; Matrices; Shape; Signal resolution; Software; Spectroscopy; Haar wavelet; derivative spectroscopy; overlapped Lorentzian peak-signals; spectral par amter;
Conference_Titel :
Signal Processing (ICSP), 2010 IEEE 10th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-5897-4
DOI :
10.1109/ICOSP.2010.5655138