DocumentCode :
3392280
Title :
Two levels vs. three levels of maintenance: the cost
Author :
Hughes, Wallace ; Kim, Matthew M. ; McGauley, Richard M. ; Mortin, Davie E. ; Serabo, Gregory A.
fYear :
1989
fDate :
25-28 Sep 1989
Firstpage :
19
Lastpage :
25
Abstract :
The authors describe level-of-repair analyses for four major US Army weapon/communication systems using the Optimum Supply and Maintenance Model (OSAMM). The four systems are: Single Channel Objective Tactical Terminal (SCOTT); Global Positioning System (GPS); Single Channel Ground and Airborne Radio System (SINCGARS); and Hawk guided missile. The analyses compare the costs associated with a strict two-level maintenance concept with the resulting costs of other maintenance alternatives (e.g. three- and four-level, with and without screening). The authors identify the sensitivity of the resulting cost to such factors as inaccurate built-in test (BIT); TMDE (test measurement and diagnostic equipment) costs, including test program sets; provisioning levels and supply support measures, including number and placement of test equipment and maintenance personnel; and the impact of repair vs. discard. The cost of each policy is assessed not only in terms of dollars, but also in terms of operational availability and system readiness
Keywords :
automatic testing; economics; electronic equipment testing; maintenance engineering; military systems; missiles; radio systems; satellite relay systems; weapons; Global Positioning System; Hawk guided missile; Optimum Supply and Maintenance Model; Single Channel Ground and Airborne Radio System; Single Channel Objective Tactical Terminal; TMDE; US Army weapon/communication systems; built-in test; cost; level-of-repair analyses; operational availability; readiness; three level maintenance; two-level maintenance; Availability; Built-in self-test; Costs; Global Positioning System; Missiles; Performance analysis; Performance evaluation; Test equipment; Testing; Weapons;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '89. IEEE Automatic Testing Conference. The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.
Conference_Location :
Philadelphia, PA
Type :
conf
DOI :
10.1109/AUTEST.1989.81093
Filename :
81093
Link To Document :
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