• DocumentCode
    3392518
  • Title

    Potential benefits of using commercial simulators to test equipment control systems

  • Author

    Ruppel, Francis ; Wysor, Wes

  • Author_Institution
    Oak Ridge Nat. Lab., TN, USA
  • fYear
    1997
  • fDate
    10-12 Sep 1997
  • Firstpage
    196
  • Lastpage
    200
  • Abstract
    Motivation is given for a technique to more thoroughly test semiconductor equipment control systems. A description is given of a simulator-based control system testing technique. Potential benefits that could be realized by using this technique in the semiconductor industry as well as benefits documented by using this technique in other industries are described. Specific requirements for using the technique in the semiconductor industry are outlined. A summary of a survey of nine commercial simulation systems is given. Finally, the outcome of the survey is compared with the requirements for using the technique
  • Keywords
    automatic testing; control engineering computing; control systems; semiconductor device manufacture; simulation; commercial simulator; equipment control system testing; semiconductor fab; Control system synthesis; Control systems; Electrical equipment industry; Electronics industry; Semiconductor device reliability; Semiconductor device testing; System software; System testing; Test equipment; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference and Workshop, 1997. IEEE/SEMI
  • Conference_Location
    Cambridge, MA
  • ISSN
    1078-8743
  • Print_ISBN
    0-7803-4050-7
  • Type

    conf

  • DOI
    10.1109/ASMC.1997.630733
  • Filename
    630733