DocumentCode :
3392518
Title :
Potential benefits of using commercial simulators to test equipment control systems
Author :
Ruppel, Francis ; Wysor, Wes
Author_Institution :
Oak Ridge Nat. Lab., TN, USA
fYear :
1997
fDate :
10-12 Sep 1997
Firstpage :
196
Lastpage :
200
Abstract :
Motivation is given for a technique to more thoroughly test semiconductor equipment control systems. A description is given of a simulator-based control system testing technique. Potential benefits that could be realized by using this technique in the semiconductor industry as well as benefits documented by using this technique in other industries are described. Specific requirements for using the technique in the semiconductor industry are outlined. A summary of a survey of nine commercial simulation systems is given. Finally, the outcome of the survey is compared with the requirements for using the technique
Keywords :
automatic testing; control engineering computing; control systems; semiconductor device manufacture; simulation; commercial simulator; equipment control system testing; semiconductor fab; Control system synthesis; Control systems; Electrical equipment industry; Electronics industry; Semiconductor device reliability; Semiconductor device testing; System software; System testing; Test equipment; Virtual manufacturing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Manufacturing Conference and Workshop, 1997. IEEE/SEMI
Conference_Location :
Cambridge, MA
ISSN :
1078-8743
Print_ISBN :
0-7803-4050-7
Type :
conf
DOI :
10.1109/ASMC.1997.630733
Filename :
630733
Link To Document :
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