DocumentCode
3392518
Title
Potential benefits of using commercial simulators to test equipment control systems
Author
Ruppel, Francis ; Wysor, Wes
Author_Institution
Oak Ridge Nat. Lab., TN, USA
fYear
1997
fDate
10-12 Sep 1997
Firstpage
196
Lastpage
200
Abstract
Motivation is given for a technique to more thoroughly test semiconductor equipment control systems. A description is given of a simulator-based control system testing technique. Potential benefits that could be realized by using this technique in the semiconductor industry as well as benefits documented by using this technique in other industries are described. Specific requirements for using the technique in the semiconductor industry are outlined. A summary of a survey of nine commercial simulation systems is given. Finally, the outcome of the survey is compared with the requirements for using the technique
Keywords
automatic testing; control engineering computing; control systems; semiconductor device manufacture; simulation; commercial simulator; equipment control system testing; semiconductor fab; Control system synthesis; Control systems; Electrical equipment industry; Electronics industry; Semiconductor device reliability; Semiconductor device testing; System software; System testing; Test equipment; Virtual manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Manufacturing Conference and Workshop, 1997. IEEE/SEMI
Conference_Location
Cambridge, MA
ISSN
1078-8743
Print_ISBN
0-7803-4050-7
Type
conf
DOI
10.1109/ASMC.1997.630733
Filename
630733
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