• DocumentCode
    3392590
  • Title

    Logistics impacts and influences of ATE designed to meet the TLM concept

  • Author

    Bryant, William ; Timmons, James

  • Author_Institution
    San Antonio Air Logistics Center, Kelly AFB, TX, USA
  • fYear
    1989
  • fDate
    25-28 Sep 1989
  • Firstpage
    32
  • Lastpage
    36
  • Abstract
    The two-level maintenance (TLM) concept is being advocated as a means of increasing support capability and reducing the total cost of system maintenance. Traditionally, the Air Force has used a three level maintenance concept, with a heavy emphasis on base level, in-shop repair. In the 1970s and 1980s, this approach to maintenance and the expanding technology of automated test systems resulted in sophisticated and powerful, but costly and resource-consuming automated test systems being developed and deployed worldwide. With continuing advances in reliability, and emphasis on supportable designs, it is apparent that, under certain combinations of resource costs, item reliability, and usage rates, two levels of maintenance provide more support at less cost and consume less resources than does three-level maintenance. The objective of TLM is to eliminate, when feasible, the base-level repair shop from the maintenance structure. The authors explore the rationale behind and the methods of identifying the optimum level of repair, and explain why it is necessary to analyze the requirements before assigning a particular maintenance task to a certain level of maintenance
  • Keywords
    automatic test equipment; economics; electronic equipment testing; maintenance engineering; military systems; ATE; Air Force; automated test systems; cost; costs; electronic equipment testing; military systems; reliability; repair; system maintenance; two-level maintenance; Automatic testing; Costs; Logistics; Maintenance; Packaging; Pipelines; Power system reliability; Storage area networks; System testing; Weapons;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '89. IEEE Automatic Testing Conference. The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.
  • Conference_Location
    Philadelphia, PA
  • Type

    conf

  • DOI
    10.1109/AUTEST.1989.81095
  • Filename
    81095